Capacitance |
Should be within the specified tolerance |
NPO: (Class I) Cap≤ 1000pF 1.0±0.2Vrms, 1MHz±10% Cap>1000pF 1.0±0.2Vrms, 1KHz±10% X7R, X5R, Y5V: (Class II) Cap≤ 10uF 1.0±0.2Vrms, 1KHz±10% Cap>10uF 0.5±0.1Vrms, 120Hz±10% |
(DF, tanδ) Dissipation Factor |
NPO (ClassⅠ) |
DF |
Capacitance |
Measuring Frequency |
Measuring Voltage |
≤0.56% |
Cr<5 pF |
1MHZ±10% |
1.0±0.2Vrms |
1.5[(150/Cr)+7]×10-4 |
5pF≤Cr<50 pF |
≤0.15% |
50pF≤Cr≤1000 pF |
≤0.15% |
>1000 pF |
1KHZ±10% |
X7R, X5R,Y5V: (Class II) |
X7R X5R (≥0402) |
≥50V |
25V |
16V |
10V |
6.3V |
Cap≤ 10uF 1.0±0.2Vrms, 1KHz±10% Cap>10uF 0.5±0.1Vrms, 120Hz±10% |
≤2.5% |
≤3.5%(C<0.47uF) ≤10.0%(C≥0.47uF) |
≤5%(C<0.15uF) ≤10.0%(C≥0.15uF) |
X7R X5R (<0402) |
≤3.5% |
≤5.0% |
≤5.0%(C<0.047uF) ≤10.0%(C≥0.047uF) |
≤7.5%(C<0.047uF) ≤10.0%(C≥0.047uF) |
Y5V |
≥25V |
16V |
10V |
6.3V |
≤7.0%(C<1.0uF) ≤9.0%(C≥1.0uF) |
≤15% |
≤15% |
≤15% |
Insulation Resistance |
NPO (ClassⅠ) |
C≤10 nF, Ri≥50000MΩ C>10 nF, Ri• CR≥500S |
Measuring Voltage: Rated Voltage(Max 500V) Duration: 60±5s Test Humidity: ≤75% Test Temperature: 25℃±5℃ Test Current: ≤50mA |
X7R, X5R: (Class II) |
C≤25 nF, Ri≥10000MΩ C>25 nF, Ri• CR>100S |
Y5V (Class II) |
C≤25 nF, Ri≥4000MΩ C>25 nF, Ri• CR>100S |
Dielectric Withstanding Voltage |
No breakdown or damage |
Measuring Voltage: ClassⅠ:300% Rated voltage ClassⅡ:250% Rated voltage Duration: 1~5s Charge/ Discharge Current: 50mA max. (This method excludes high-voltage MLCC) |
Solderability |
At least 95% of the terminal electrode is covered by new solder. Visual Appearance: No visible damage. |
Preheating conditions:80 to 120℃; 10~30s. |
Solder Temperature: 235±5℃(Sn/Pb:63/37) Duration: 2±0.5s |
Solder Temperature: 245±5℃(Lead-free) Duration: 2±0.5s |
Resistance to Soldering Heat |
Item |
NPO to SL |
X7R / X5R |
Y5V |
Preheating conditions: 100 to 200℃; 10±2min. Solder Temperature: 265±5℃ Duration: 10±1s Clean the capacitor with solvent and examine it with a 10X(min.) microscope. Recovery Time: 24±2h Recovery condition: Room temperature |
ΔC/C |
≤±0.5% or ±0.5PF whichever is larger |
-5~+10% |
-10~+20% |
DF |
Same to initial value |
IR |
Same to initial value |
Appearance:No visible damage. At least 95% of the terminal electrode is covered by new solder. |
Resistance to Flexure of Substrate (Bending Strength) |
Appearance: No visible damage ΔC/C: ≤±10% |
Test Board: Al2O3 or PCB Warp: 1mm Speed: 0.5mm/sec. Unit: mm The measurement should be made with the board in the bending position. |
Termination Adhesion |
No visible damage |
Applied Force: 5N Duration: 10±1S |
Temperature Cycle |
NPO: ΔC/C:≤±1% or ±1pF, whichever is larger. X7R/X5R: ΔC/C: ≤±10% Y5V: ΔC/C: ≤±20% |
Preheating conditions: up-category temperature, 1h Recovery time: 24±1h Initial Measurement Cycling Times: 5 times, 1 cycle, 4 steps: |
Step |
Temp.(℃) |
Time(min |
1 |
Low- category temp NPO/X7R/X5R : -55 Y5V: -25 |
30±3 |
2 |
Normal temp. (+20) |
2-3 |
3 |
Up- category temp NPO/X7R/ : -125 X5R /Y5V: -85 |
30±3 |
4 |
Normal temp. (+20) |
2-3 |
Recovery time after test: 24±2h |
Moisture Resistance |
NPO: ΔC/C :≤±2% or ±1pF, whichever is larger. X7R/X5R: ΔC/C: ≤±10% Y5V: ΔC/C: ≤±30% DF: Not more than twice of initial value. IR: |
Temperature:40±2℃ Humidity:90~95%RH Duration:500h Recovery conditions:Room temperature |
|
NPO: Ri≥2500MΩ或 Ri• CR≥ 25S whichever is smaller |
Recovery Time:24h (Class1) or 48h (Class2) |
|
X7R/X5R/Y5V: Ri≥1000MΩ或 Ri• CR≥25S whichever is smaller. |
|
Appearance: No visible damage |
Life Test |
NPO: ΔC/C :≤±2% or ±1pF,whichever is larger. X7R/X5R ΔC/C ≤±20% Y5V: ΔC/C ≤±30% DF: Not more than twice of initial value. IR: NPO: Ri≥4000MΩ或 Ri• CR≥40S whichever is smaller X7R/X5R/Y5V: Ri≥2000MΩ或 Ri• CR≥50S whichever is smaller. |
Low-Voltage(≤100V) Applied Voltage: 1.5 × Rated Voltage Duration: 1000h Temperature:125℃(NPO、X7R) 85℃(X5R、 Y5V) Charge/ Discharge Current: 50mA max. Recovery Conditions: Room Temperature Recovery Time: 24h (Class 1), or 48h (Class2) |
|
Appearance: No visible damage |
Middle &high voltage Life Test |
NPO: ΔC/C :≤±2% or ±1pF,whichever is larger. X7R/X5R ΔC/C ≤±20% Y5V: ΔC/C ≤±30% DF: Not more than twice of initial value. IR: NPO: Ri≥4000MΩ或 Ri• CR≥40S whichever is smaller X7R/X5R/Y5V: Ri≥2000MΩ或 Ri• CR≥50S whichever is smaller. Appearance: No visible damage |
Applied Voltage: 100 V≤Rated Voltage<500 V:2 Multiple 500 V≤Rated Voltage≤1000V:1.5 Multiple >1000 V Rated Voltage:1.2 Multiple Duration: 1000h Charge/ Discharge Current: 50mA max. Temperature:125℃(NPO X7R);85℃(X5R、 Y5V) Recovery Conditions: Room Temperature Recovery Time: 24h (Class 1), or 48h (Class2) |